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Trends in Vacuum Science & Technology   Volumes
Trends in Vacuum Science & Technology
Volume 5
Published in 2002
Table of Contents
1 The mechanism of the formation of the Si(111) 7x7 reconstruction
Pages  1 -  29
Hiroshi Tochihara, Wataru Shimada
Abstract | Buy this article 
2 Time-of-flight secondary ion mass spectrometry: quantitative approaches
Pages  31 -  43
Liji Huang
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3 X-ray-induced ion desorption from solid surfaces
Pages  45 -  74
Yuji Baba
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4 Spin polarized empty states spectroscopy of thin films and multilayers
Pages  75 -  88
F. Ciccacci, G. Isella, L. Duo, M. Marcon, R. Bertacco
Abstract | Buy this article 
5 Mechanism of electric field emission from DLC surfaces
Pages  89 -  95
Ahalapitiya H. Jayatissa, Fumio Sato, Nobuo Saito
Abstract | Buy this article 
6 Growth and optoelectronic properties of hydrogenated nanostructured silicon
Pages  97 -  114
A. Hadjadj
Abstract | Buy this article 
7 Properties of sol-gel SiO2 materials containing metals and metal oxide particles: a review
Pages  115 -  168
A. Mendoza-Galvan, J. Gonzalez-Hernandez
Abstract | Buy this article 


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